Seminar organised by EMAT

Subject : Various applications of quantitative electron microscopy

Speaker: Wouter Van den Broek, EMAT, University of Antwerp

Abstract:

 In quantitative electron microscopy, object parameters like for example particle diameters, are estimated from the absolute image intensities. In order to estimate these parameters correctly, extensive use needs to be made of models that describe the object and/or the image process, image analysis and statistics. In this talk four different applications of quantitative electron microscopy are presented: Optimal spot size selection in STEM; Measurement of the modulation transfer function of the CCD; Correction of non-linear thickness effects in tomography; and Estimation of atom positions from various projections.

When and where: Friday, December 2, 2011 at 11.30 h in room X.009, Campus Groenenborger